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Wafer And Lead Frame

High Repeatability Precision and Trueness of Au / Pd Coating Measurements on Leadframes along with Specific X-ray Fluorescence Measuring Instruments (XRF) for Measurements and Analyses of Coating Thicknesses and Compositions on Wafers for Measurements on structures on wafers in the electronics and semiconductor industries

 
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FISCHER MEASUREMENT TECHNOLOGIES INDIA P.LTD

Address: City Centre, Office Nos.3, 4 And 5, First Floor, Plot No.138/1, Rajiv Gandhi Infotech Park, Behind Persistent, Phase 1, Hinjewadi
Mulshi, Pune-411057 (Maharashtra)

E-mail: Send E-Mail

Web: www.goldenpages.in/fischer

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